发明名称 |
Capacitor test method and circuit therefor |
摘要 |
In one embodiment, a closed loop control system is caused to operate in an open loop configuration. At some time while operating in the open loop configuration the system detected the presence or absence of a.c. signals in an output signal of the system in order to detect the presence or absence of a failure of a control loop element, such as an output capacitor. |
申请公布号 |
US8179156(B2) |
申请公布日期 |
2012.05.15 |
申请号 |
US20090621951 |
申请日期 |
2009.11.19 |
申请人 |
HORSKY PAVEL;KAMENICKY PETR;SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
发明人 |
HORSKY PAVEL;KAMENICKY PETR |
分类号 |
G01R31/40 |
主分类号 |
G01R31/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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