发明名称 Systems and Methods for Measuring Surface Shape
摘要 A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.
申请公布号 US2012113391(A1) 申请公布日期 2012.05.10
申请号 US201213356131 申请日期 2012.01.23
申请人 FARRER STEPHEN W.;COPLAND JAMES;RAYMOND THOMAS D.;XIONG WEI;AMO WAVEFRONT SCIENCES LLC 发明人 FARRER STEPHEN W.;COPLAND JAMES;RAYMOND THOMAS D.;XIONG WEI
分类号 A61B3/107 主分类号 A61B3/107
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