发明名称 |
Method for fabricating semiconductor device |
摘要 |
A method for fabricating a semiconductor device includes growing an AlN layer by MOVPE in which a nitrogen-source flow ratio at a far side from a substrate is set lower than that at a near side, the nitrogen-source flow ratio being a ratio of a flow rate of a nitrogen source to a total flow rate of growth gas; and growing a GaN-based semiconductor layer on the AlN layer by MOVPE. |
申请公布号 |
US8173464(B2) |
申请公布日期 |
2012.05.08 |
申请号 |
US20100727809 |
申请日期 |
2010.03.19 |
申请人 |
YOKOYAMA MITSUNORI;SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC. |
发明人 |
YOKOYAMA MITSUNORI |
分类号 |
H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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