发明名称 Method for fabricating semiconductor device
摘要 A method for fabricating a semiconductor device includes growing an AlN layer by MOVPE in which a nitrogen-source flow ratio at a far side from a substrate is set lower than that at a near side, the nitrogen-source flow ratio being a ratio of a flow rate of a nitrogen source to a total flow rate of growth gas; and growing a GaN-based semiconductor layer on the AlN layer by MOVPE.
申请公布号 US8173464(B2) 申请公布日期 2012.05.08
申请号 US20100727809 申请日期 2010.03.19
申请人 YOKOYAMA MITSUNORI;SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC. 发明人 YOKOYAMA MITSUNORI
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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