| 摘要 |
<P>PROBLEM TO BE SOLVED: To further improve a security property with a simplified circuit. <P>SOLUTION: A semiconductor integrated circuit device (100) includes a plurality of function blocks (125-127), a fetch unit (131), a detection unit (132) and a determination unit (150) and shifts to a test mode when an operation pattern is changed in accordance with a predetermined rule. The plurality of function blocks (125-127) operate in response to instructions from a control device (200). The fetch unit (131) fetches a signal indicating an operation state of each of the plurality of function blocks (125-127). The detection unit (132) detects a change in operation state of at least one function block among the plurality of function blocks (125-127). The determination unit (150) determines whether or not an operation pattern indicated by a fetched signal indicating the operation pattern is changed in accordance with the predetermined rule. <P>COPYRIGHT: (C)2012,JPO&INPIT |
