发明名称 Simplified particle emitter and method of operating thereof
摘要 An emitter assembly for emitting a charged particle beam along an optical axis is described. The emitter assembly being housed in a gun chamber and includes an emitter having an emitter tip, wherein the emitter tip is positioned at a first plane perpendicular to the optical axis and wherein the emitter is configured to be biased to a first potential, an extractor having an opening, wherein the opening is positioned at a second plane perpendicular to the optical axis and wherein the extractor is configured to be biased to a second potential, wherein the second plane has a first distance from the first plane of 2.25 mm and above.
申请公布号 EP2444990(A1) 申请公布日期 2012.04.25
申请号 EP20100187979 申请日期 2010.10.19
申请人 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH 发明人 LANIO, STEFAN;FROSIEN, JUERGEN
分类号 H01J37/063;H01J37/06;H01J37/08;H01J37/09;H01J37/16 主分类号 H01J37/063
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