DEVICE AND METHOD FOR REPAIR ANALYSIS

摘要

PURPOSE: An apparatus and method for analyzing a repair are provided to reduce an area overhead by performing a redundancy analysis operation of the entire memory for a short time. CONSTITUTION: A selecting unit(610) selects a part of row addresses of a plurality of spare pivot fault cells in response to a control code and selects a part of column addresses. An analysis unit(620) generates an analysis signal which shows whether a plurality of row addresses of non spare pivot fault cell are included in the row addresses selected by the selecting unit and a plurality of column addresses of non spare pivot fault cell are included in the column addresses selected by the selecting unit.