发明名称 COVER GLASS FOR SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a cover glass for semiconductor package and its manufacturing method which has a suitable thermal expansion coefficient for plastic package, is capable of precision detection of foreign substances and dust by imaging inspection and shows always a small value in &alpha;-ray emission. <P>SOLUTION: This cover glass includes &le;75% SiO<SB POS="POST">2</SB>, 1.1-20% Al<SB POS="POST">2</SB>O<SB POS="POST">3</SB>, 0-10% B<SB POS="POST">2</SB>O<SB POS="POST">3</SB>, 0.1-20% Na<SB POS="POST">2</SB>O, 0-11% K<SB POS="POST">2</SB>O, and 0-20% alkaline earth metal oxide, in terms of mass%. The mean thermal expansion coefficient is 90-180&times;10<SP POS="POST">-7</SP>/&deg;C in the temperature range of 30-380&deg;C. Young's modulus is 68 GPa or more. The &alpha;-ray emission quantity of the glass is below 0.05 c/cm<SP POS="POST">2</SP>/hr. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012076991(A) 申请公布日期 2012.04.19
申请号 JP20110194600 申请日期 2011.09.07
申请人 NIPPON ELECTRIC GLASS CO LTD 发明人 KOMAI TAKAKO;MURATA TAKASHI;YODOGAWA MASAHIRO
分类号 C03C3/083;C03C3/091;H01L23/08 主分类号 C03C3/083
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