发明名称 CHEMICAL MECHANICAL POLISHING PAD WITH LIGHT STABLE POLYMERIC ENDPOINT DETECTION WINDOW AND METHOD OF POLISHING THEREWITH
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad that is adapted for polishing a substrate selected from a magnetic substrate, an optical substrate and a semiconductor substrate. <P>SOLUTION: In the chemical mechanical polishing pad, the aromatic polyamine and the isocyanate terminated prepolymer polyol are provided at an amine moiety to unreacted-NCO moiety stoichiometric ratio of <95%. The light stable polymeric endpoint detection window exhibits a time dependent strain of &le;0.02% when measured with a constant axial tensile load of 1 kPa at a constant temperature of 60&deg;C at 100 minutes, and an optical double pass transmission of &ge;15% at a wavelength of 380 nm for a window thickness of 1.3 mm. Also, the polishing surface of the chemical mechanical polishing pad is adapted for polishing the substrate selected from the magnetic substrate, the optical substrate and the semiconductor substrate. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012071416(A) 申请公布日期 2012.04.12
申请号 JP20110205548 申请日期 2011.09.21
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC 发明人 LOYACK ADAM;ALAN NAKATANI;KULP MARY JO;KELLY DAVID G
分类号 B24B37/20;B24B37/013;B24B49/12;H01L21/304 主分类号 B24B37/20
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