发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To increase the thickness of a single-crystal semiconductor layer in a semiconductor substrate including the single-crystal semiconductor layer such as an SOI substrate, and improve the mass productivity of the semiconductor substrate. <P>SOLUTION: An amorphous semiconductor layer is formed on a single-crystal semiconductor substrate, and then the substrate is attached to a support substrate with an insulation layer interposed therebetween, so that a part of the single-crystal semiconductor substrate is transferred onto the support substrate together with the amorphous semiconductor layer. Then, the amorphous semiconductor layer is subjected to solid-phase epitaxial growth, whereby a thick single-crystal semiconductor layer is formed on the support substrate. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012074680(A) 申请公布日期 2012.04.12
申请号 JP20110182083 申请日期 2011.08.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 NAKANO HAJIME;NODA KOSEI;ISHIKAWA MAKOTO;TAKEUCHI TOSHIHIKO
分类号 H01L21/02;H01L21/20;H01L21/336;H01L27/12;H01L29/786 主分类号 H01L21/02
代理机构 代理人
主权项
地址