发明名称 CLEANING METHOD, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a cleaning method capable of shortening a cleaning processing time and preventing residual materials from remaining in a processing chamber after cleaning. <P>SOLUTION: The method comprises a step for setting the temperature of a reaction tube after a thin film is formed on a substrate in the reaction tube consisting of heat-resistant nonmetallic members to first temperature and for removing adhered matter including a thin film which is adhered to an inner wall of the reaction tube by supplying a cleaning gas into the reaction tube; and a step for setting the temperature of the reaction tube after the adhered matter is removed to the second temperature being higher than the first temperature and for removing residual materials on a wall surface of the reaction tube by supplying a cleaning gas to the reaction tube. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012074738(A) 申请公布日期 2012.04.12
申请号 JP20110286362 申请日期 2011.12.27
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 NOMURA HISASHI;KAMEDA KENJI;MINAMI MASAKATSU
分类号 H01L21/31;C23C16/44 主分类号 H01L21/31
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