ON-CHIP JITTER DATA ACQUISITION CIRCUIT, AND JITTER MEASUREMENT DEVICE AND METHOD

摘要

PROBLEM TO BE SOLVED: To provide an on-chip jitter data acquisition circuit that can perform jitter measurement without requiring a high-frequency probe.

SOLUTION: An on-chip jitter data acquisition circuit 1 comprises: a variable delay part 10 that delays a clock signal with any one of plural delay amounts that can be selected by a delay amount selection signal; a phase comparison signal generation part 20 for generating a phase comparison signal by comparing the phase of the clock signal and the phase of the clock signal that has been delayed by the variable delay part; and a phase comparison signal acquisition part 30 for acquiring the phase comparison signal during a predetermined period.

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