发明名称 Device for continuous quality control of applied parts
摘要 <p>The method involves operating a measuring device provided with a measuring head (2), for performing quality control of geometric, structural, functional parameters of applied staple (6). The measuring head is provided with a permanent magnet (3) and two giant magneto resistance (GMR) sensor chips (4a,4b), such that GMR sensor chips are provided on both sides of the permanent magnet. The detection of integral geometric condition of the staple is performed by the GMR sensor chips. An independent claim is included for measuring device.</p>
申请公布号 EP2439075(A1) 申请公布日期 2012.04.11
申请号 EP20110183850 申请日期 2011.10.04
申请人 MUELLER MARTINI HOLDING AG 发明人 SCHENKER, THOMAS;VON AESCH, BEAT;LIEBI, THOMAS
分类号 B42B4/00;G01R33/09 主分类号 B42B4/00
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