发明名称 Method and algorithm for random half pitched interconnect layout with constant spacing
摘要 An embodiment of a system and method produces a random half pitched interconnect layout. A first normal-pitch mask and a second normal-pitch mask are created from a metallization layout having random metal shapes. The lines and spaces of the first mask are printed at normal pitch and then the lines are shrunk to half pitch on mask material. First spacers are used to generate a half pitch dimension along the outside of the lines of the first mask. The mask material outside of the first spacer pattern is partially removed. The spacers are removed and the process is repeated with the second mask. The mask material remains at the locations of first set of spacers and/or the second set of spacers to create a half pitch interconnect mask with constant spaces.
申请公布号 US8148247(B2) 申请公布日期 2012.04.03
申请号 US20100906799 申请日期 2010.10.18
申请人 JUENGLING WERNER;MICRON TECHNOLOGY, INC. 发明人 JUENGLING WERNER
分类号 H01L21/3205;H01L21/4763 主分类号 H01L21/3205
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