发明名称 Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same
摘要 A method of forming a material. The method comprises conducting an ALD layer cycle of a first metal, the ALD layer cycle comprising a reactive first metal precursor and a co-reactive first metal precursor. An ALD layer cycle of a second metal is conducted, the ALD layer cycle comprising a reactive second metal precursor and a co-reactive second metal precursor. An ALD layer cycle of a third metal is conducted, the ALD layer cycle comprising a reactive third metal precursor and a co-reactive third metal precursor. The ALD layer cycles of the first metal, the second metal, and the third metal are repeated to form a material, such as a GeSbTe material, having a desired stoichiometry. Additional methods of forming a material, such as a GeSbTe material, are disclosed, as is a method of forming a semiconductor device structure including a GeSbTe material.
申请公布号 US8148197(B2) 申请公布日期 2012.04.03
申请号 US20100844595 申请日期 2010.07.27
申请人 MARSH EUGENE P.;MICRON TECHNOLOGY, INC. 发明人 MARSH EUGENE P.
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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