| 发明名称 |
HIGH-PRESSURE QUARTZ CRYSTAL MICROBALANCE |
| 摘要 |
The present invention relates to a high-pressure quartz crystal microbalance sensor that is capable of measuring adsorption and diffusion characteristics of nanoporous materials and thin films at high pressures. |
| 申请公布号 |
US2012078541(A1) |
申请公布日期 |
2012.03.29 |
| 申请号 |
US201113208842 |
申请日期 |
2011.08.12 |
| 申请人 |
HESKETH PETER;NAIR SANKAR;MCCARLEY KEN;NAVAEI MILAD;BAGNALL KEVIN;VENKATASUBRAMANIAN ANANDRAM;CONOCOPHILLIPS COMPANY - IP SERVICES GROUP;GEORGIA TECH RESEARCH CORPORATION |
发明人 |
HESKETH PETER;NAIR SANKAR;MCCARLEY KEN;NAVAEI MILAD;BAGNALL KEVIN;VENKATASUBRAMANIAN ANANDRAM |
| 分类号 |
G06F19/00;G01N7/00;G01N9/00 |
主分类号 |
G06F19/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
