发明名称 SUBSTRATE POSITION DETECTION APPARATUS, FILM DEPOSITION APPARATUS EQUIPPED WITH THE SAME, AND SUBSTRATE POSITION DETECTION METHOD
摘要 A substrate position detection method includes rotating the susceptor so that the substrate receiving portion is moved into an image taking area of a imaging apparatus; detecting first two position detection marks provided in the process chamber so that the first two position detection marks are within the image taking area, wherein a first perpendicular bisector of the first two position detection marks passes through a rotational center of the susceptor; detecting second two position detection marks provided in the susceptor so that the second two position detection marks can be within the image taking area, wherein a second perpendicular bisector of the second two position detection marks passes through the rotational center of the susceptor and a center of the substrate receiving portion; and determining whether the substrate receiving portion is positioned in a predetermined range in accordance with the detected first two and second two position detection marks.
申请公布号 US2012075460(A1) 申请公布日期 2012.03.29
申请号 US201113236700 申请日期 2011.09.20
申请人 AIKAWA KATSUYOSHI;HONMA MANABU;TOKYO ELECTRON LIMITED 发明人 AIKAWA KATSUYOSHI;HONMA MANABU
分类号 H01L21/66;G08B21/00;H04N7/18 主分类号 H01L21/66
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