发明名称 POST ION IMPLANT STRIPPER FOR ADVANCED SEMICONDUCTOR APPLICATION
摘要 The present invention relates to a substantially water-free photoresist stripping composition. Particularly, the present invention relates to a substantially water-free photoresist stripping composition useful in removing the photoresist after ion-implant process, comprising: (a) an amine, (b) an organic solvent A, and (c) a co-solvent, wherein the composition is substantially water-free (<3 wt % H2O). The present invention also provides a process for post-ion implantation stripping by using the composition of the present invention.
申请公布号 IL217708(D0) 申请公布日期 2012.03.29
申请号 IL20120217708 申请日期 2012.01.24
申请人 BASF SE 发明人
分类号 H01L 主分类号 H01L
代理机构 代理人
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