发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要 Provided is a semiconductor device manufacturing method and a substrate processing apparatus. The method comprise: a first process of forming a film containing a predetermined element on a substrate by supplying a source gas containing the predetermined element to a substrate processing chamber in which the substrate is accommodated; a second process of removing the source gas remaining in the substrate processing chamber by supplying an inert gas to the substrate processing chamber; a third process of modifying the predetermined element-containing film formed in the first process by supplying a modification gas that reacts with the predetermined element to the substrate processing chamber; a fourth process of removing the modification gas remaining in the substrate processing chamber by supplying an inert gas to the substrate processing chamber; and a filling process of filling an inert gas in a gas tank connected to the substrate processing chamber.
申请公布号 US2012073500(A1) 申请公布日期 2012.03.29
申请号 US201113311760 申请日期 2011.12.06
申请人 SATO TAKETOSHI;TSUNEDA MASAYUKI 发明人 SATO TAKETOSHI;TSUNEDA MASAYUKI
分类号 H01L21/00;C23C16/455;C23C16/52 主分类号 H01L21/00
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