发明名称 |
Test apparatus for testing a device under test and device for receiving a signal |
摘要 |
A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern. |
申请公布号 |
US8145965(B2) |
申请公布日期 |
2012.03.27 |
申请号 |
US20080125936 |
申请日期 |
2008.05.23 |
申请人 |
NAGATANI KENICHI;SAWARA ATSUO;NAKAGAWA HIROSHI;ADVANTEST CORPORATION |
发明人 |
NAGATANI KENICHI;SAWARA ATSUO;NAKAGAWA HIROSHI |
分类号 |
G11C29/00;G01R31/28;G06F11/00 |
主分类号 |
G11C29/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|