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发明名称
TESTING APPARATUS FOR THE SURFACE OF SEMICONDUCTOR AND TESTING METHOD FOR PIN-HOLE FORMED ON THE SURFACE OF SEMICONDUCTOR USING THE SAME
摘要
申请公布号
KR101126218(B1)
申请公布日期
2012.03.22
申请号
KR20100039570
申请日期
2010.04.28
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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