发明名称 Method of manufacturing semiconductor device and semiconductor device
摘要 A method of manufacturing a semiconductor device includes steps of forming a semiconductor device layer on an upper surface of a substrate including the upper surface, a lower surface and a dislocation concentrated region arranged so as to part a first side closer to the upper surface and a second side closer to the lower surface, exposing a portion where the dislocation concentrated region does not exist above on the lower surface by removing the substrate on the second side along with at least a part of the dislocation concentrated region, and forming an electrode on the portion.
申请公布号 US8134171(B2) 申请公布日期 2012.03.13
申请号 US201113105386 申请日期 2011.05.11
申请人 MIYAKE YASUTO;HIROYAMA RYOJI;HATA MASAYUKI;SANYO ELECTRIC CO., LTD. 发明人 MIYAKE YASUTO;HIROYAMA RYOJI;HATA MASAYUKI
分类号 H01L33/00;H01S5/323 主分类号 H01L33/00
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