发明名称 ETCHING METHOD, ETCHING SYSTEM AND ETCHING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To form a hole having a high aspect ratio and reaching a contact part in a silicon oxide film, which enables a sufficient contact to be made between a contact material in the hole and the contact part. <P>SOLUTION: The method comprises: (Step 1) preparing a subject of processing which has, on a substrate, a first oxide film made of silicon oxide containing at least one of B and P, a second oxide film formed thereon and made of silicon oxide containing neither B nor P, and a contact part formed below an interface of the first and second oxide films; (Step 2) etching the second and first oxide films to form a hole reaching the contact part; and (Step 3) etching the first oxide film by a dry process using HF gas and inert gas to widen part of the hole in a region over the contact part of the first oxide film. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012049566(A) 申请公布日期 2012.03.08
申请号 JP20110256191 申请日期 2011.11.24
申请人 TOKYO ELECTRON LTD 发明人 TOZAWA SHIGEKI;MURAKI YUSUKE
分类号 H01L21/3065;H01L21/302;H01L21/768 主分类号 H01L21/3065
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