发明名称 METHOD FOR FABRICATING NON-VOLATILE MEMORY DEVICE
摘要 <p>PURPOSE: A nonvolatile memory device is provided to improve the mechanical intensity of an insulation layer at each layer by forming the insulation layer with a net structure. CONSTITUTION: A semiconductor substrate(100) is made of single crystal semiconductor materials. A common source line(117) electrically connected to a source is formed on the semiconductor substrate. A filler shaped semiconductor pattern is formed on the semiconductor substrate. A memory cell string includes a gate group(142) comprising cell transistors. A charge storage film group is located between the gate group and the semiconductor pattern.</p>
申请公布号 KR20120019654(A) 申请公布日期 2012.03.07
申请号 KR20100082982 申请日期 2010.08.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOO, DONG CHUL;HWANG, KI HYUN;CHOI, HAN MEI;KIM, JIN GYUN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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