<p>PURPOSE: A nonvolatile memory device is provided to improve the mechanical intensity of an insulation layer at each layer by forming the insulation layer with a net structure. CONSTITUTION: A semiconductor substrate(100) is made of single crystal semiconductor materials. A common source line(117) electrically connected to a source is formed on the semiconductor substrate. A filler shaped semiconductor pattern is formed on the semiconductor substrate. A memory cell string includes a gate group(142) comprising cell transistors. A charge storage film group is located between the gate group and the semiconductor pattern.</p>
申请公布号
KR20120019654(A)
申请公布日期
2012.03.07
申请号
KR20100082982
申请日期
2010.08.26
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
YOO, DONG CHUL;HWANG, KI HYUN;CHOI, HAN MEI;KIM, JIN GYUN