发明名称 Method and system for simulating test instruments and instrument functions
摘要 Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.
申请公布号 US8131529(B2) 申请公布日期 2012.03.06
申请号 US20060514717 申请日期 2006.09.01
申请人 ADVANCED TESTING TECHNOLOGIES INC. 发明人 SPINNER ROBERT;LEVI ELI;LEIPPE WILLIAM HAROLD;KORPI EMERY;LAI MICHAEL;KUVEIKIS JAMES;CHALMERS RICHARD E.;ENGEL RICHARD;BRITCH PETER F.;BIAGIOTTI WILLIAM;HOWELL DAVID
分类号 G06F9/44;G06F13/10;G06F13/12 主分类号 G06F9/44
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