| 摘要 |
An apparatus and method for the dynamic detection and compensation of performance variations within an integrated circuit (IC) is provided to detect performance variations within the IC at any stage of test or operation. An arbitrary reference signal is utilized in conjunction with an internal oscillation device to establish a speed reference that may be used to characterize the IC. Dynamic detection and compensation may also be configured within a plurality of geographic locations within the IC, so that performance variations may be detected and compensated. Test data that is indicative of the IC's performance may be dynamically generated continuously, or at programmable intervals, so that performance variations caused by virtually any source may be substantially detected and compensated at any point in time of the IC's life cycle.
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