发明名称 Method of manufacturing a semiconductor device having an electrode exposed through a hole
摘要 A method of manufacturing a semiconductor device may include, but is not limited to the following processes. A first insulating film is formed over a substrate. A second insulating film is formed on the first insulating film. An electrode penetrating the first and the second insulating films is formed. A part of the second insulating film and a part of the electrode are removed so that a first hole is formed in the second insulating film. A first portion of the electrode is exposed through the first hole. A part of the first portion of the electrode is removed by an isotropic etching.
申请公布号 US8124493(B2) 申请公布日期 2012.02.28
申请号 US20100846305 申请日期 2010.07.29
申请人 KOMEDA KENJI;ELPIDA MEMORY, INC. 发明人 KOMEDA KENJI
分类号 H01L21/20;H01L21/311 主分类号 H01L21/20
代理机构 代理人
主权项
地址