发明名称 Method for screening early failure of ceramic capacitor
摘要 A method of screening ceramic capacitors. The method includes the steps of: charging the ceramic capacitors by applying a constant d.c. voltage which is larger than the rated voltage and smaller than the breakdown voltage; and leaving the charged ceramic capacitor in a temperature around the maximum working temperature for a specific period of time with both terminals of each ceramic capacitor opened electrically; and eliminating defective capacitors whose residual voltage values are smaller than a specific voltage value.
申请公布号 US5510719(A) 申请公布日期 1996.04.23
申请号 US19940291158 申请日期 1994.08.16
申请人 MURATA MANUFACTURING CO., LTD. 发明人 YAMAMOTO, SHIGEKATSU
分类号 H01G4/12;G01R31/01;H01G13/00;(IPC1-7):G01R31/12 主分类号 H01G4/12
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