发明名称 |
Method for screening early failure of ceramic capacitor |
摘要 |
A method of screening ceramic capacitors. The method includes the steps of: charging the ceramic capacitors by applying a constant d.c. voltage which is larger than the rated voltage and smaller than the breakdown voltage; and leaving the charged ceramic capacitor in a temperature around the maximum working temperature for a specific period of time with both terminals of each ceramic capacitor opened electrically; and eliminating defective capacitors whose residual voltage values are smaller than a specific voltage value.
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申请公布号 |
US5510719(A) |
申请公布日期 |
1996.04.23 |
申请号 |
US19940291158 |
申请日期 |
1994.08.16 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
YAMAMOTO, SHIGEKATSU |
分类号 |
H01G4/12;G01R31/01;H01G13/00;(IPC1-7):G01R31/12 |
主分类号 |
H01G4/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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