发明名称 DEVICE FAILURE EVALUATION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a device failure evaluation system capable of evaluating the state of a consumer device by combining an analysis of a harmonic in the electric signal measured at the consumer device and an analysis about the physical quantity other than the electric signal. <P>SOLUTION: The device failure evaluation system includes a harmonic abnormality evaluation part, a frequency abnormality evaluation part, and a device failure estimating part. The harmonic abnormality evaluation part generates a first evaluation result which evaluates a state of the consumer device based on the electric signal measured on the consumer device that operates upon receiving the supply of electric power. The frequency abnormality evaluation part generates a second evaluation result that evaluates a state of the consumer device based on the acoustic signal measured on the consumer device. The device failure estimating part, based on the first and second evaluation results, estimates a failure occurring at the consumer device or an abnormality which is a sign of failure. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012039768(A) 申请公布日期 2012.02.23
申请号 JP20100177904 申请日期 2010.08.06
申请人 TOSHIBA CORP 发明人
分类号 H02J3/00 主分类号 H02J3/00
代理机构 代理人
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