| 摘要 |
A non-destructive inspection apparatus includes a transmitting section, a reception section and a processing unit. The transmission section irradiates an electromagnetic wave signal toward an inspection target. The reception section receives a reflected electromagnetic wave signal from the inspection target to generate a received wave signal. The processing unit generates a fundamental reflected wave signal predicted to be received from each reflection point of the inspection target, and determines the existence or nonexistence of any defects in the inspection target and the details of the defect, if there exists, based on a pattern matching between a waveform of the received wave signal and a waveform of a linear combination of fundamental reflected wave signals.
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