发明名称 ELECTROSTATIC DISCHARGE PROTECTION STRUCTURES FOR HIGH SPEED TECHNOLOGIES WITH MIXED AND ULTRA-LOW VOLTAGE SUPPLIES
摘要 A semiconductor integrated circuit (IC) is provided with an electrostatic discharge (ESD) protection circuit. The ESD protection circuit includes a pad (102) connected to a first voltage source of a protected circuit node of the IC, and a silicon controlled rectifier (SCR) (106) having an anode coupled to the first voltage source, and the cathode coupled to a second voltage source. Capacitive turn-on devices are coupled between a first gate of the SCR and the first voltage source and a second gate of the SCR and the second voltage source.
申请公布号 WO2006014875(A3) 申请公布日期 2006.09.08
申请号 WO2005US26332 申请日期 2005.07.25
申请人 SARNOFF CORPORATION;SARNOFF EUROPE BVBA;MERGENS, MARKUS, PAUL, JOSEF;RUSS, CORNELIUS, CHRISTIAN;ARMER, JOHN;VERHAEGE, KOEN, GERARD, MARIA 发明人 MERGENS, MARKUS, PAUL, JOSEF;RUSS, CORNELIUS, CHRISTIAN;ARMER, JOHN;VERHAEGE, KOEN, GERARD, MARIA
分类号 H02H9/00;H01L27/02;H02H3/20;H02H3/22;H03K17/0812;H03K17/0814;H03K17/30 主分类号 H02H9/00
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