ELECTROSTATIC DISCHARGE PROTECTION STRUCTURES FOR HIGH SPEED TECHNOLOGIES WITH MIXED AND ULTRA-LOW VOLTAGE SUPPLIES
摘要
A semiconductor integrated circuit (IC) is provided with an electrostatic discharge (ESD) protection circuit. The ESD protection circuit includes a pad (102) connected to a first voltage source of a protected circuit node of the IC, and a silicon controlled rectifier (SCR) (106) having an anode coupled to the first voltage source, and the cathode coupled to a second voltage source. Capacitive turn-on devices are coupled between a first gate of the SCR and the first voltage source and a second gate of the SCR and the second voltage source.
申请公布号
WO2006014875(A3)
申请公布日期
2006.09.08
申请号
WO2005US26332
申请日期
2005.07.25
申请人
SARNOFF CORPORATION;SARNOFF EUROPE BVBA;MERGENS, MARKUS, PAUL, JOSEF;RUSS, CORNELIUS, CHRISTIAN;ARMER, JOHN;VERHAEGE, KOEN, GERARD, MARIA
发明人
MERGENS, MARKUS, PAUL, JOSEF;RUSS, CORNELIUS, CHRISTIAN;ARMER, JOHN;VERHAEGE, KOEN, GERARD, MARIA