| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method enabling evaluation of the chemical state and/or electronic state of an interface between a conductive layer and an organic layer even when the thickness of both the conductive layer and the organic layer is ca. 15 nm or more. <P>SOLUTION: There is provided a method for evaluation of the chemical state and/or the electronic state in vicinity of an interface between a conductive layer and an organic layer contained in a sample which is target to be measured by measuring energy of photoelectron generated by irradiation of the interface between the conductive layer and the organic layer with hard X ray. <P>COPYRIGHT: (C)2012,JPO&INPIT |
