发明名称 DISPLAY PANEL TEST APPARATUS AND METHOD OF TESTING A DISPLAY PANEL USING THE SAME
摘要 A display panel test apparatus includes: an image pickup part which picks up an image from a target display panel; a jig including a receiving part which receives the target display panel, a fixing part which fixes the image pickup part, and an adjusting part which adjusts an image pickup angle of the image pickup part; a pattern generating part which provides the target display panel with a test pattern; a defect extracting part which analyzes test image data provided from the image pickup part using a defect extracting algorithm and extracts display defect information, where the defect extracting algorithm includes different settings corresponding to different types of display defects; and a control part which generates evaluated data corresponding to a viewing angle of the target display panel using the image pickup angle of the image pickup part and the display defect information.
申请公布号 US2012026315(A1) 申请公布日期 2012.02.02
申请号 US20100976476 申请日期 2010.12.22
申请人 LEE BUM-SUK;LEE EUNG-SANG;PARK GI-CHANG;KIM JONG-JIN;PARK CHAN-YOUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE BUM-SUK;LEE EUNG-SANG;PARK GI-CHANG;KIM JONG-JIN;PARK CHAN-YOUN
分类号 H04N7/18 主分类号 H04N7/18
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