发明名称 |
DISPLAY PANEL TEST APPARATUS AND METHOD OF TESTING A DISPLAY PANEL USING THE SAME |
摘要 |
A display panel test apparatus includes: an image pickup part which picks up an image from a target display panel; a jig including a receiving part which receives the target display panel, a fixing part which fixes the image pickup part, and an adjusting part which adjusts an image pickup angle of the image pickup part; a pattern generating part which provides the target display panel with a test pattern; a defect extracting part which analyzes test image data provided from the image pickup part using a defect extracting algorithm and extracts display defect information, where the defect extracting algorithm includes different settings corresponding to different types of display defects; and a control part which generates evaluated data corresponding to a viewing angle of the target display panel using the image pickup angle of the image pickup part and the display defect information.
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申请公布号 |
US2012026315(A1) |
申请公布日期 |
2012.02.02 |
申请号 |
US20100976476 |
申请日期 |
2010.12.22 |
申请人 |
LEE BUM-SUK;LEE EUNG-SANG;PARK GI-CHANG;KIM JONG-JIN;PARK CHAN-YOUN;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE BUM-SUK;LEE EUNG-SANG;PARK GI-CHANG;KIM JONG-JIN;PARK CHAN-YOUN |
分类号 |
H04N7/18 |
主分类号 |
H04N7/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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