发明名称 PROCESS OF PREPARING AN ANISOTROPIC MULTILAYER USING PARTICLE BEAM ALIGNMENT
摘要 The invention relates to a process of preparing a multilayer comprising two or more anisotropic layers with different optical axes by using a particle beam etching technique, to a multilayer obtained by said process, to the use of such a multilayer as optical compensator or retarder in optical and electrooptical devices, and to devices comprising such a multilayer.
申请公布号 US2012013831(A1) 申请公布日期 2012.01.19
申请号 US201013258492 申请日期 2010.03.11
申请人 PARRI OWAIN LLYR;YAROSHCHUK OLEG;KRAVCHUK RUSLAN;MERCK PATENT GMBH 发明人 PARRI OWAIN LLYR;YAROSHCHUK OLEG;KRAVCHUK RUSLAN
分类号 G02F1/1335;B29D11/00 主分类号 G02F1/1335
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