发明名称 ATOMIC LAYER DEPOSITION APPARATUS
摘要 A method and apparatus for atomic layer deposition (ALD) is described. In one embodiment, an apparatus comprises a vacuum chamber body having a contiguous internal volume comprised of a first deposition region spaced-apart from a second deposition region, the chamber body having a feature operable to minimize intermixing of gases between the first and the second deposition regions, a first gas port formed in the chamber body and positioned to pulse gas preferentially to the first deposition region to enable a first deposition process to be performed in the first deposition region, and a second gas port formed in the chamber body and positioned to pulse gas preferentially to the second deposition region to enable a second deposition process to be performed in the second deposition region is provided.
申请公布号 US2012006265(A1) 申请公布日期 2012.01.12
申请号 US201113235855 申请日期 2011.09.19
申请人 CHIN BARRY L.;MAK ALFRED W.;LEI LAWRENCE CHUNG-LAI;XI MING;CHUNG HUA;LAI KEN KAUNG;BYUN JEONG SOO 发明人 CHIN BARRY L.;MAK ALFRED W.;LEI LAWRENCE CHUNG-LAI;XI MING;CHUNG HUA;LAI KEN KAUNG;BYUN JEONG SOO
分类号 C23C16/455;C23C16/44;C23C16/458 主分类号 C23C16/455
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