发明名称 |
SEMICONDUCTOR DEVICE CAPABLE OF SUPPRESSING A COUPLING EFFECT OF A TEST-DISABLE TRANSMISSION LINE |
摘要 |
Semiconductor device and semiconductor memory device include a plurality of internal circuits configured to perform test operations in response to their respective test mode signals and a plurality of test-mode control units configured to control the test operations of the internal circuits to be disabled in response to a test-off signal. |
申请公布号 |
US2012001175(A1) |
申请公布日期 |
2012.01.05 |
申请号 |
US201113229086 |
申请日期 |
2011.09.09 |
申请人 |
AHN JEONG-YOON;JANG JI-EUN;KU YOUNG-JUN |
发明人 |
AHN JEONG-YOON;JANG JI-EUN;KU YOUNG-JUN |
分类号 |
H01L23/58 |
主分类号 |
H01L23/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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