发明名称 PHOTOMASK, METHOD FOR MANUFACTURING SUCH PHOTOMASK AND PATTERN FORMING METHOD USING SUCH PHOTOMASK
摘要 A mask pattern including, for example, a light-shielding portion 101 and a first transparent portion 104A surrounded with a semi-light-shielding portion 102 are provided on a transparent substrate 100 . The mask pattern includes a first pattern region and a second pattern region opposing each other with the semi-light-shielding portion 102 and the first transparent portion 104A sandwiched therebetween.
申请公布号 EP1992988(A4) 申请公布日期 2011.12.28
申请号 EP20070737406 申请日期 2007.02.27
申请人 PANASONIC CORPORATION 发明人 MISAKA, AKIO
分类号 G03F1/29;G03F1/32;G03F1/54;G03F1/68;H01L21/027 主分类号 G03F1/29
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