发明名称 POLISHING DEVICE AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing device and a method in which a substrate can be withdrawn (released) from a top ring of the substrate safely and efficiently by reducing deformation of the substrate such as a semiconductor wafer and a stress applied to the substrate, thereby preventing defect and damage of the substrate. <P>SOLUTION: The polishing device comprises a polishing table having a polishing surface, a substrate holding device having a substrate holding surface composed at least partially of an elastic membrane 4 and pressing a substrate W against the polishing surface while holding the substrate W on the substrate holding surface, a substrate transfer mechanism 150 which delivers the substrate W to/from the substrate holding device at a position where the substrate W is delivered to/from the substrate holding device, a substrate peeling promotion mechanism 153 provided integrally with or separately from the substrate transfer mechanism 150 in order to peel the substrate W from the substrate holding surface, a rotary drive mechanism which rotationally drives the substrate holding device, a detection mechanism which detects the rotation angle position of the substrate holding device, and a control unit 50 which controls the rotation angle position of the substrate holding device. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011258639(A) 申请公布日期 2011.12.22
申请号 JP20100129906 申请日期 2010.06.07
申请人 EBARA CORP 发明人 FUKUSHIMA MAKOTO;WATANABE KAZUHIDE;YASUDA HOZUMI;NAMIKI KEISUKE;NABEYA OSAMU;TOGASHI SHINGO;YAMAKI AKIRA
分类号 H01L21/304;B24B37/04;B24B37/30;H01L21/683 主分类号 H01L21/304
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