NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION METHOD USING GUIDED WAVE

摘要

A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.