发明名称 |
NONVOLATILE MEMORY DEVICE, PROGRAM METHOD THEREOF, MEMORY SYSTEM INCLUDING NONVOLATILE MEMORY DEVICE, ELECTRONIC EQUIPMENT AND SYSTEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nonvolatile memory device capable of reducing a change in a threshold voltage due to coupling noise, Vpass failure and Vpgm failure, a programming method thereof, a memory system including the nonvolatile memory device, electronic equipment and a system. <P>SOLUTION: The nonvolatile memory device of the present invention includes: a memory cell array composed of a plurality of physical pages; and a program sequencer for determining a program sequence such that the plurality of physical pages are secondarily programmed after the plurality of physical pages are primarily programmed. A program state P0 of a primary program operation is lower than a word line voltage applied to the plurality of physical pages in a bit line setup section of a secondary program operation. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011253609(A) |
申请公布日期 |
2011.12.15 |
申请号 |
JP20110123309 |
申请日期 |
2011.06.01 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
CUI QIHUAN;YI SONG-SU;PARK JAE-WOO;ZHU SUNG-HYUNG |
分类号 |
G11C16/02;G11C16/04;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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