| 摘要 |
<P>PROBLEM TO BE SOLVED: To obtain a circuit testing device which tests a logic circuit without stopping a system using the logic circuit, with a simple configuration. <P>SOLUTION: The circuit testing device is provided with a test object function alternative part 11 which uses an FPGA to reconfigure a logic circuit having the same function as a test object part 10 executing a part of operation of the system. A test object input selection part 15 selects test information from a test data preparation part 16 to output the test information to the test object part 10 when the test object part 10 is tested, and selects input information from a system preceding stage P1 to output the input information to the test object part 10 when the test object part 10 executes a part of operation of the system. An effective circuit selection part 14 selects a processing result of the test object function alternative part 11 after reconfiguration to output the processing result to a system succeeding stage Q1 when the test object part 10 is tested, and selects a processing result of the test object part 10 to output the processing result to the system succeeding stage Q1 when the test object part 10 executes a part of operation of the system. <P>COPYRIGHT: (C)2012,JPO&INPIT |
