发明名称 PARTICLE BEAM IRRADIATION SYSTEM AND CONTROL METHOD FOR PARTICLE BEAM IRRADIATION SYSTEM
摘要 <p>Provided is a particle beam irradiation system wherein a higher-accuracy dose distribution is given. An irradiation control unit (13) is provided with an energy setting controller (14) for setting the energy of a charged particle beam, a beam scanning controller (16) for controlling a beam scanner (41), and a beam diameter controller (15) for controlling a beam diameter changer (40, 60). The irradiation control unit (13) performs control such that the beam diameter of the charged particle beam is set to a first beam diameter by the beam diameter controller (15), a predetermined region to be irradiated is irradiated with the charged particle beam by scanning the charged particle beam in a stepwise form by the beam scanning controller (16), the beam diameter of the charged particle beam is set to a second beam diameter different from the first beam diameter by the beam diameter controller (15), and a region overlapping with at least part of the predetermined region to be irradiated is irradiated with the charged particle beam by scanning the charged particle beam in a stepwise form by the beam scanning controller (16).</p>
申请公布号 WO2011148486(A1) 申请公布日期 2011.12.01
申请号 WO2010JP58979 申请日期 2010.05.27
申请人 MITSUBISHI ELECTRIC CORPORATION;HARADA HISASHI 发明人 HARADA HISASHI
分类号 G21K1/02;A61N5/10;G21K1/093 主分类号 G21K1/02
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