| 摘要 |
<P>PROBLEM TO BE SOLVED: To enhance accuracy in failure detection by carrying out failure detection while changing analog quantity in a circuit as a target of the failure detection. <P>SOLUTION: A tuning circuit (104 A) changes an analog quantity of a target failure detection circuit (104B) under a predetermined conditions. A failure detecting circuit (103) determines changes in the status of the target failure detection circuit based on the changes of the analog quantity in the target failure detection circuit and detects a failure in the target failure detection circuit. With this, a failure in the target failure detection circuit can be detected without monitoring the output of the failure detecting circuit (103) outside a semiconductor device. Moreover, since it is adapted that the changes in actual status of the target failure detection circuit due to the changes in the analog quantity in the target failure detection circuit is determined by the failure detecting circuit, the accuracy of failure detection can be increased. <P>COPYRIGHT: (C)2012,JPO&INPIT |
