发明名称 SCANNING MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To be able to obtain an image of an a observation target area of a sample easier and quicker. <P>SOLUTION: In a scanning confocal microscope, a surface to be observed of a sample is scanned with illumination light and an observation image R11 of the surface to be observed for each time is acquired continuously. In the first scan, the confocal microscope scans the entire surface to be observed with illumination light and records line information showing an observation target line by setting a line composed of pixels having a predetermined luminance value or more among lines composed of pixels aligning in the x-direction of the acquired observation image R11 as an observation target line. And, in the second scan, the confocal microscope controls the scanning of the surface to be observed so as to scan only the area of the surface to be observed corresponding to the observation target line shown in the line information, thereby enabling to scan only the area with a region to be observed such as a fluorescent area W11 and acquiring and the image of the region to be observed easier and quicker. This invention can be applied to a scanning confocal microscope. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011237616(A) 申请公布日期 2011.11.24
申请号 JP20100109152 申请日期 2010.05.11
申请人 NIKON CORP 发明人 HORIKOSHI MASARU
分类号 G02B21/06;G02B21/36;G02B26/10 主分类号 G02B21/06
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