发明名称 BURN-IN BOARD, BURN-IN DEVICE, AND BURN-IN SYSTEM
摘要 PURPOSE: A burn-in board, a burn-in device, and a burn-in system are provided to read an output signal in a row from a device under test by establishing a programmable logic device on the burn-in board. CONSTITUTION: An arrangement setting circuit(200) establishes the arrangement of a programmable logic device(150). The arrangement setting circuit establishes a tester bus interface(210), a burn-in test executive circuit(220), a serial/parallel conversion circuit(230), a frequency conversion circuit(240), an output driver circuit(250), and a comparator circuit(260). A pin of the programmable logic device which is connected with a device under test is composed of a drive pin(270) and an I/O pin(280). The drive pin of the programmable logic device and the drive pin(272) of a socket are connected as one-and-one correspondence relation. The I/O pin of the programmable logic device and an I/O pin(282) of the socket are connected as one-and-one correspondence relation.
申请公布号 KR20110126503(A) 申请公布日期 2011.11.23
申请号 KR20100072240 申请日期 2010.07.27
申请人 JAPAN ENGINEERING CO., LTD. 发明人 YUZURIHARA. AKIMASA;KUMAGAI TAKESHI;SATO KAZUHIKO
分类号 G01R31/3193;G01R31/3183;H01R33/76 主分类号 G01R31/3193
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