A SYSTEM AND METHOD FOR THIN FILM QUALITY ASSURANCE

摘要

A method of a photovoltaic panel (104) quality control, said method comprising: enabling a relative movement in at least one direction (112) between the photovoltaic panel (104) and a low-resolution scanning imaging unit (132) and capturing successive two-dimensional frames of the scanned area; analyzing the aquired image frames for presence of thin film production defects (144) and communicating to a high resolution image scanning unit (136) locations of said production defects; enabling a relative movement (148) between the photovoltaic panel and the high resolution scanning unit said, movement following the low-resolution unit movement and at least one additional direction parallel to the photovoltaic panel movement direction to aquire and classify the thin film production defects communicated by the low resolution scanning unit; and wherein the low and high resolution scanning units move simultaneously with the same speed (124) across the photovoltaic panel and the speed of the high resolution scanning unit moving in the direction parallel to the thin film movement direction is different from the speed at which the photovoltaic panel moves.