发明名称 Semiconductor manufacturing apparatus
摘要 A semiconductor manufacturing includes: an ion source and a beam line for introducing an ion beam into a target film which is formed over a wafer with an insulating film interposed therebetween; a flood gun for supplying the target film with electrons for neutralizing charges contained in the ion beam; a rotating disk for subjecting the target film to mechanical scanning of the ion beam in two directions composed of r-&thetas; directions; a rear Faraday cage for measuring the current density produced by the ion beam; a disk-rotational-speed controller and a disk-scanning-speed controller for changing the scanning speed of the target film; and a beam current/current density measuring instrument for controlling, according to the current density, the scanning speed of the target film.
申请公布号 US8058631(B2) 申请公布日期 2011.11.15
申请号 US20090637272 申请日期 2009.12.14
申请人 NIWAYAMA MASAHIKO;YONEDA KENJI;PANASONIC CORPORATION 发明人 NIWAYAMA MASAHIKO;YONEDA KENJI
分类号 G01K1/08;H01J3/26 主分类号 G01K1/08
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