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发明名称
Verfahren zum Bilden einer Pufferschicht-Architektur auf Silizium und dadurch gebildete Strukturen
摘要
申请公布号
DE112009000917(A5)
申请公布日期
2011.11.10
申请号
DE200911000917T
申请日期
2009.06.08
申请人
INTEL CORPORATION
发明人
HUDAIT, MANTU K.;TOLCHINSKY, PETER G.;CHOW, LOREN A.;LOUBYCHEV, DIMITRI;FASTENAU, JOEL M.;LIU, AMY W. K.
分类号
H01L21/20;H01L29/78
主分类号
H01L21/20
代理机构
代理人
主权项
地址
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