| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and a device which enable accurate measurement of electrical potential distribution on a surface of a sample without being affected by a projection or depression structure of several microns or more or large electrical potential difference in the measurement of surface electrical potential distribution of the sample using a scanning probe microscope such as a KFM or an SMM even when the sample is located in solution or the sample contains solution. <P>SOLUTION: A measurement sample 6 is placed between an opposite electrode 7 and an insulating film 2 facing each other through a pedestal 5 so that the measurement sample 6 is in contact with the insulating film 2. The surface electrical potential distribution of the measurement sample is indirectly measured by measuring the surface electrical potential distribution of the insulating film using a probe 1 of a scanning probe microscope. <P>COPYRIGHT: (C)2012,JPO&INPIT |
