发明名称 Flip chip for electrical function test and manufacturing method thereof
摘要 Disclosed is a method for manufacturing a flip chip, in which a gold typically used in a flip chip manufacturing is adhered by conductive adhesives, wherein the method comprises steps of depositing a metal seed layer on a substrate; applying and patterning a photoresist or a dry film; forming a gold bump by electroplating; patterning the seed layer; forming an insulating layer on the seed layer and upper end of the gold bump; and patterning an insulating layer. Accordingly, it is possible to manufacture a flip chip, in which electrical function between bumps can be evaluated, with less cost.
申请公布号 US8048793(B2) 申请公布日期 2011.11.01
申请号 US20080203280 申请日期 2008.09.03
申请人 SUNGKYUNKWAN UNIVERSITY FOUNDATION FOR CORPORATE COLLABORATION 发明人 JUNG SEUNG BOO;KIM JONG WOONG
分类号 H01L21/60 主分类号 H01L21/60
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