发明名称 Pitch multiplied mask patterns for isolated features
摘要 Crisscrossing spacers formed by pitch multiplication are used as a mask to form isolated features, such as contacts vias. A first plurality of mandrels are formed on a first level and a first plurality of spacers are formed around each of the mandrels. A second plurality of mandrels is formed on a second level above the first level. The second plurality of mandrels is formed so that they cross, e.g., are orthogonal to, the first plurality of mandrels, when viewed in a top down view. A second plurality of spacers is formed around each of the second plurality of mandrels. The first and the second mandrels are selectively removed to leave a pattern of voids defined by the crisscrossing first and second pluralities of spacers. These spacers can be used as a mask to transfer the pattern of voids to a substrate. The voids can be filled with material, e.g., conductive material, to form conductive contacts.
申请公布号 US8043915(B2) 申请公布日期 2011.10.25
申请号 US20100813157 申请日期 2010.06.10
申请人 MICRON TECHNOLOGY, INC. 发明人 TRAN LUAN C.
分类号 H01L21/84 主分类号 H01L21/84
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